EOS 3D-Druck
mit pco.edge 5.5

Additive manufacturing is currently making a giant leap towards mass production. Technological processes have matured and industrial 3D printing has proven to be an efficient manufacturing process. EOS is launching an innovative quality monitoring solution for optical tomography. The heart of the system is the pco.edge sCMOS camera.

Modular Wafer Inspection
with pco.edge 5.5

Silicon carbide (SiC) is a wide bandgap semiconductor, which is especially used for high-power, high-temperature and high-frequency devices due to its high energy efficiency. Despite great improvements in the material quality of SiC substrates and epitaxial wafers within the last years, critical defects like stacking faults (SFs) and basal plane dislocations (BPDs) can still lead to bipolar degradation and finally to complete failure of the device.